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Service / Technology Instance

About Sample Characterisation for Serial Crystallography, XFEL, Hamburg, Germany

View All Crystallisation at Instruct

The ‘Sample Characterization for Serial Crystallography’ service focuses on evaluating microcrystal suspensions to ensure optimal quality for XFEL data collection. With state-of-the-art equipment and experienced staff, users can characterize their samples in detail and refine preparation strategies accordingly.

This service is to ensure that crystal quality and sample properties are well understood prior to beamtime, thereby improving data collection efficiency and overall experimental success.

Our laboratory is equipped with advanced instruments for comprehensive sample assessment, including Dynamic Light Scattering (DLS) for evaluating particle size distribution, Transmission Electron Microscopy (TEM) for direct visualization of microcrystals and, where feasible, diffraction tests, and Second-Order Nonlinear Imaging of Chiral Crystals (SONICC) for detecting protein crystals in complex mixtures. These techniques enable the detailed analysis of crystal morphology, size, homogeneity, and diffraction potential.

This service can be accessed through both remote and on-site modes, depending on the user’s needs and the nature of the characterization tasks.

 

 

Service Availability:

Remote

Physical

Instruments Available:

The facility provides consultation and support for beamtime proposal writing, assisting users in defining experimental strategies, describing sample delivery approaches, and articulating technical feasibility. Our staff can help researchers refine their proposal sections related to sample preparation and delivery, improving the overall clarity and competitiveness of submissions.

This service is available through both remote and on-site access, depending on users’ needs and the nature of the planned experiments.

Equipment available:

-Jeol 2100 Plus, TEM

-Wyatt DynaPro NanoStar, DLS

-Xtal Concepts SpectroLight 610, DLS

-Malvern Zetasizer Advance-Ultra, DLS zeta-potential analyzer

-Formulatrix SONICC, microcrystal imaging system

User Guide

TEM (transmission electron microscope), Jeol 2100 Plus

-  The JEOL 2100Plus is a 200 kV transmission electron microscope (TEM) that provides high-resolution imaging. For protein crystals of sub-micrometre size, there are few available methods to assess crystal quality. In such cases, TEM imaging can reveal the crystal lattice and confirm the diffraction capability of the sample.

DLS (dynamic light scattering)

Wyatt DynaPro NanoStar

Xtal Concepts SpectroLight 610

DLS/zeta-potential analyzer, Malvern Zetasizer Advance-Ultra

- The Wyatt DynaPro NanoStar and XtalConcept SpectroLight 610 are DLS instruments used to measure the size and size distribution of nanoparticles, proteins, and other macromolecules in solution. The Malvern Zetasizer Advance Ultra additionally measures zeta potential to assess colloidal stability. These instruments can be used to evaluate the quality of proteins prior to crystallization and to determine the size and distribution of protein micro- and nanocrystals.

Microcrystal imaging system, Formulatrix SONICC

-SONICC (Second Order Nonlinear Imaging of Chiral Crystals) is automated imaging system to detect tiny or hidden protein crystals using Second Harmonic Generation (SHG) and Ultraviolet Two-Photon Excited Fluorescence (UV-TPEF) techniques.

Consulting on beamtime proposal writing

- The service provides support for beamtime proposal preparation, assisting researchers in defining experimental strategies based on sample characterization. This service is particularly beneficial for researchers who are new to serial crystallography.

Instruct Centre

Instruct-Hamburg (DESY, CSSB, European XFEL)

Hamburg

Germany

Sample Characterisation for Serial Crystallography, XFEL, Hamburg, Germany

Contacts:

Huijong Han
Huijong Han
European X-Ray Free-Electron Laser
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Christina Schmidt
Christina Schmidt

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